HPMug2oMmNrOfxWQHLiEksa6s0hFu9Ox348d7QefarYlaFR5ArkhOwm3Da1pmxmxCtenj1+6luWD#r#n+EPn9L6Ce+9onqnMlT+i ›› 2010, Vol. 26 ›› Issue (5): 52-56.DOI: 10.3969/j.issn.1009-0479.2010.05.012
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Abstract: Ｉｎｄｉｇｉｔａｌｃｉｒｃｕｉｔｅｘｐｅｒｉｍｅｎｔｓ，ｂａｓｉｃｓｅｒｉｅｓｏｆｄｉｇｉｔａｌｉｎｔｅｇｒａｔｅｄｃｉｒｃｕｉｔｓｃｈｉｐｓａｒｅｅｘｔｅｎｓｉｖｅｌｙ ｕｓｅｄ．Ｑｕａｌｉｔｙａｎｄｔｙｐｅｏｆｃｈｉｐｓｓｈｏｕｌｄｂｅｔｅｓｔｅｄｂｅｆｏｒｅｕｓｅ．Ｅｎｇｉｎｅｅｒｉｎｇｓｐｅｃｉｆｉｃｔｅｓｔｅｒｓｉｎｔｈｅｍａｒｋｅｔ ａｒｅｅｘｐｅｎｓｉｖｅａｎｄｃａｎｔｔｅｓｔｍａｎｙｄｉｇｉｔａｌｃｈｉｐｓｉｎｌａｂｏｒａｔｏｒｙ．Ｉｎｔｅｇｒａｔｉｎｇａｄｖａｎｔａｇｅｓａｎｄｄｉｓａｄｖａｎｔａｇｅｓｏｆ ｖａｒｉｏｕｓｅｘｉｓｔｉｎｇｔｙｐｅｓｏｆｔｅｓｔｅｒｓａｎｄａｄｏｐｔｉｎｇＳＴＣ８９Ｃ５１６ＲＤ ＋ＳＣＭａｎｄＣｈｉｎｅｓｅＬＣＤｄｉｓｐｌａｙ，ｔｈｅａｕ ｔｈｏｒｓｄｅｓｉｇｎｅｄａｓｉｍｐｌｅｄｉｇｉｔａｌｔｅｓｔｅｒｓｙｓｔｅｍ，ｗｈｉｃｈｃｏｕｌｄｉｄｅｎｔｉｆｙｔｈｅｑｕａｌｉｔｙａｎｄｔｙｐｅｏｆｌｏｇｉｃｃｈｉｐｓｃｏｍ ｍｏｎｌｙｕｓｅｄｉｎｄｉｇｉｔａｌｅｌｅｃｔｒｏｎｉｃｔｅｃｈｎｏｌｏｇｙｅｘｐｅｒｉｍｅｎｔｓ．Ｍｏｒｅｏｖｅｒ，ｉｔｉｓｃｈｅａｐａｎｄｃａｎａｃｈｉｅｖｅｔｈｅｉｎｔｅｒ ａｃｔｉｏｎｏｆＣｈｉｎｅｓｅｌａｎｇｕａｇｅｉｎｔｅｒｆａｃｅ．
Key words: ＳＴＣｍｉｃｒｏｃｏｎｔｒｏｌｌｅｒ, ｔｅｓｔｅｒ, Ｃｈｉｎｅｓｅｌａｎｇｕａｇｅｉｎｔｅｒｆａｃｅ
CLC Number:
TN431.2
JIN Jian-Hui, HE Chun. ＤｅｓｉｇｎｏｆＡＳｉｍｐｌｅＣｈｉｐＴｅｓｔｅｒｗｉｔｈＣｈｉｎｅｓｅＩｎｔｅｒｆａｃ[J]. HPMug2oMmNrOfxWQHLiEksa6s0hFu9Ox348d7QefarYlaFR5ArkhOwm3Da1pmxmxCtenj1+6luWD#r#n+EPn9L6Ce+9onqnMlT+i, 2010, 26(5): 52-56.
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URL: http://kmyzxb.magtech.com.cn/EN/10.3969/j.issn.1009-0479.2010.05.012
http://kmyzxb.magtech.com.cn/EN/Y2010/V26/I5/52
